Exploring the use of approximate TMR to mask transient faults in logic with low area overhead
نویسندگان
چکیده
منابع مشابه
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Single Event Transient (SET) errors in ground-level electronic devices are a growing concern in the radiation hardening field. However, effective SET mitigation technologies which satisfy groundlevel demands such as generic, flexible, efficient, and fast, are limited. The classic Triple Modular Redundancy (TMR) method is the most well-known and popular technique in space and nuclear environment...
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ورودعنوان ژورنال:
- Microelectronics Reliability
دوره 55 شماره
صفحات -
تاریخ انتشار 2015